发明名称 CHROMOSOME TEST LEARNING DEVICE, METHOD FOR LEARNING CHROMOSOME TEST, AND CHROMOSOME TEST LEARNING PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a chromosome test learning device which can realize an extremely high learning effect. <P>SOLUTION: A chromosome test learning device randomly selects sample pattern data so that a question is statistically different each time and that at least one correct answer is included, randomly displays randomly the selected sample pattern data on a display by shuffling positionally and/or directionally so that a position and/or direction of each sample pattern data is different for each question, judges whether a learner's answer is correct or not for the displayed sample pattern data, and evaluates the learner's score based on the judged answer to be displayed on the display. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011227403(A) 申请公布日期 2011.11.10
申请号 JP20100099270 申请日期 2010.04.22
申请人 ADTEC CORP 发明人 OGI MIEKO;SUZUKI AKIO;YOSHIZAWA TATSUYA
分类号 G09B7/02 主分类号 G09B7/02
代理机构 代理人
主权项
地址