发明名称 ELEMENT MAPPING METHOD, ELEMENT MAPPING DEVICE, AND METHOD FOR MANUFACTURING STEEL PRODUCT
摘要 <P>PROBLEM TO BE SOLVED: To measure a distribution state of high concentration elements and low concentration elements other than main component elements contained in a steel material. <P>SOLUTION: An electron beam source 2 irradiates an electron beam E to a steel material S. WDX3 measures a distribution state of low concentration elements other than main component elements contained in the steel material S by detecting X ray generated from irradiation of the electron beam E. EDX4 measures a distribution state of high concentration elements other than the main component elements by detecting X ray transmitted through a filter 7 made of a Cr foil, thereby enabling to measure the distribution state of the high concentration elements and the low concentration elements other than the main component elements contained in the steel material S simultaneously and with high accuracy. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2011227056(A) 申请公布日期 2011.11.10
申请号 JP20110030192 申请日期 2011.02.15
申请人 JFE STEEL CORP 发明人
分类号 G01N23/225;G01N23/207 主分类号 G01N23/225
代理机构 代理人
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