| 摘要 |
PROBLEM TO BE SOLVED: To provide an analyzing substrate capable of analyzing a trace amount of a sample or the same sample, such as, a tissue section containing two-dimensional data, or the like, at high sensitivity without going through the trouble of labor or cost, and to provide a method for manufacturing the same.SOLUTION: Metal-adhered fine particles 10 are formed uniformly on an optically flat substrate 1, and the metal-adhered fine particles 10 are constituted of fine particles 2 and the metal layers 3 adhered to the fine particles 2. The fine particles 2 remain solid-phased on the substrate 1, and the surfaces of the fine particles 2 are partially coated with the metal layers 3. The composition and the thickness of the metal layers 3 and the particle size of the fine particles 2 are such that they differ by the region on the substrate 1. |
