发明名称 METHOD FOR IMPROVING DEVICE PERFORMANCE USING EPITAXIALLY GROWN SILICON CARBON (SiC) OR SILICON-GERMANIUM (SiGe)
摘要 A semiconductor substrate including a field effect transistor (FET) and a method of producing the same wherein a stressor is provided in a recess before the source/drain region is formed. The device has an increased carrier mobility in the channel region adjacent to the gate electrode.
申请公布号 US2011254015(A1) 申请公布日期 2011.10.20
申请号 US20100760688 申请日期 2010.04.15
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DORIS BRUCE B.;FALTERMEIER JOHNATHAN E.;ADAM LAHIR M. SHAIK;HARAN BALASUBRAMANIAN S. PRANATHARTHI
分类号 H01L29/78;H01L21/336;H01L29/24 主分类号 H01L29/78
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