发明名称 |
METHOD FOR IMPROVING DEVICE PERFORMANCE USING EPITAXIALLY GROWN SILICON CARBON (SiC) OR SILICON-GERMANIUM (SiGe) |
摘要 |
A semiconductor substrate including a field effect transistor (FET) and a method of producing the same wherein a stressor is provided in a recess before the source/drain region is formed. The device has an increased carrier mobility in the channel region adjacent to the gate electrode. |
申请公布号 |
US2011254015(A1) |
申请公布日期 |
2011.10.20 |
申请号 |
US20100760688 |
申请日期 |
2010.04.15 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
DORIS BRUCE B.;FALTERMEIER JOHNATHAN E.;ADAM LAHIR M. SHAIK;HARAN BALASUBRAMANIAN S. PRANATHARTHI |
分类号 |
H01L29/78;H01L21/336;H01L29/24 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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