发明名称 SYSTEM AND METHOD FOR MEASURING FREQUENCY TEMPERATURE CHARACTERISTIC OF PIEZOELECTRIC OSCILLATOR
摘要 PROBLEM TO BE SOLVED: To provide a measuring system and a measuring method for frequency temperature characteristics of a piezoelectric oscillator, capable of measuring the frequency temperature characteristics with high accuracy without requiring strict temperature control.SOLUTION: This frequency temperature characteristic measuring system 1 for the piezoelectric oscillator includes a temperature adjustment part 40, a temperature measuring part 30, and a frequency measuring part 20, and a measurement control part 10. The temperature adjustment part 40 adjusts the temperature of the piezoelectric oscillator 2 variably. The temperature measuring part 30 measures the temperature of the piezoelectric oscillator 2. The frequency measuring part 20 measures the oscillation frequency of the piezoelectric oscillator 2. The measurement control part 10 synchronizes the temperature measurement to be performed by the temperature measuring part 30 with the frequency measurement to be performed by the frequency measuring part 20.
申请公布号 JP2011196747(A) 申请公布日期 2011.10.06
申请号 JP20100062015 申请日期 2010.03.18
申请人 SEIKO EPSON CORP 发明人 HATTORI MASAFUMI
分类号 G01R29/22 主分类号 G01R29/22
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