发明名称 X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection device capable of precisely estimating a contour of a packaging material.SOLUTION: An acquiring part acquires, for example, an image of an opening and closing part 902 of a zipper or the like from data at each brightness as a reference image. The reference image is an image (including the image of the other region thicker than one region) easily reflected in an X-ray transmission image. An estimation part estimates the contour and a seal part 904 of the packaging material 903 on the basis of the reference data related to the image of the opening and closing part 902 acquired in the acquiring part. A determination part determines the biting of a content 901 on the basis of the contour data related to the contour of the packaging material 903 estimated in the estimation part.
申请公布号 JP2011196796(A) 申请公布日期 2011.10.06
申请号 JP20100063131 申请日期 2010.03.18
申请人 ISHIDA CO LTD 发明人 TAKESHITA HIROKI;SUGIMOTO KAZUYUKI
分类号 G01N23/10;G01B15/04;G01N23/04 主分类号 G01N23/10
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