发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device that has an insulating layer with a low dielectric constant and a superior adhesion with metals, and to provide its manufacturing method.SOLUTION: The semiconductor device includes: a substrate (silicon substrate); a porous SiOCH film 12b provided on the substrate, and having a carbon-carbon coupling and the ratio (C/Si) of the number of carbon atoms to the number of silicon atoms not less than two; a recess provided to the porous SiOCH film 12b; a metal film(Cu film 22b) provided so as to plug the recess; and a modifying layer 31b contacting with a Cu film 22b and provided on the surface of the porous SiOCH film 12b in the recess. The modifying layer 31b has a small C/Si ratio and an equivalent O/Si ratio comparing to the inside of the porous SiOCH film 12b. |
申请公布号 |
JP2011199059(A) |
申请公布日期 |
2011.10.06 |
申请号 |
JP20100065029 |
申请日期 |
2010.03.19 |
申请人 |
RENESAS ELECTRONICS CORP |
发明人 |
INOUE HISAYA;MOTOYAMA KOICHI;NAKAJIMA AKIRA;UEKI MAKOTO;YAMAMOTO HIROCHIKA;HAYASHI YOSHIHIRO |
分类号 |
H01L21/768;H01L21/316;H01L23/522 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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