| 摘要 |
<p>Provided is a sample analysis system which is smaller than in the prior art. The analysis system (1) is equipped with a first measuring device (11) and a second measuring device (12) that measure samples, and a conveying device (20) that conveys a sample rack (50). The second measuring device (12) is disposed in the conveying direction on the downstream side with respect to the first measuring device (11). A first supply location (26a) at which samples are supplied to the first measuring device (11), and a second supply location (26b) at which samples are supplied to the second measuring device (12) are established on the conveying device (20). A CPU (111a) of the first measuring device (11) controls the conveyance of samples that are present at the first supply location (26a), depending on the processing status of the samples that are present at the second supply location (26b). Samples that are present at the second supply location (26b) will thus not be unintentionally conveyed. Consequently, there is no need to provide an area between the first supply location (26a) and the second supply location (26b) where the sample rack (50) is retained, enabling the sample analysis system (1) to be made smaller.</p> |
