发明名称 Methods for forming a plurality of contact holes in a microelectric device
摘要 A method including: forming a dielectric layer over a substrate of a microelectronic device; forming a photoresist layer over the dielectric layer; performing a first exposure of the photoresist layer to permit portions of the dielectric layer to be removed at a first plurality of locations; subsequent to performing the first exposure, performing a second exposure of the photoresist layer to permit portions of the dielectric layer to be removed at a second plurality of locations different from the first plurality of locations; removing the portions of the dielectric layer at each of i) the first plurality of locations and ii) the second plurality of locations; and etching the dielectric layer at each of i) the first plurality of locations and ii) the second plurality of locations to respectively form a contact hole at each of the i) the first plurality of locations and ii) the second plurality of locations.
申请公布号 US8003523(B1) 申请公布日期 2011.08.23
申请号 US20100767626 申请日期 2010.04.26
申请人 MARVELL INTERNATIONAL LTD. 发明人 WU ALBERT;WEI CHIEN-CHUAN
分类号 H01L21/475 主分类号 H01L21/475
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