SEMICONDUCTOR DEVICE WITH HAVE DEEP TRENCH WITHOUT CRITICAL DIMENSION DIFFERENCE BETWEEN TOP AND BOTTOM AREA AND METHOD FOR MANUFACTURING SAME
摘要
PURPOSE: A semiconductor which has a trench without a CD difference between the top and bottom of the semiconductor and a manufacturing method thereof are provided to form a capacitor electrode of a fixed CD on the top and the bottom of the semiconductor, thereby obtaining a DRAM cell with superior electrical features. CONSTITUTION: A trench(130) is filled with an organic material polymer. An etching gas is supplied to the trench. The etching gas includes an H-F group in the organic material polymer. The organic material polymer is reacted with the H-F group to generate a wet etchant. The sidewall of the trench is selectively etched. The trench of a fixed CD is formed on the top and the bottom of the semiconductor by eliminating the organic material polymer.
申请公布号
KR20110093213(A)
申请公布日期
2011.08.18
申请号
KR20100013113
申请日期
2010.02.12
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, HYO SAN;YOON, BO UN;LEE, KUN TACK;KANG, DAE HYUK;MOON, SEONG HO;HAN, SO RA