发明名称 FORMATION OF SILICON STRUCTURES WITH DISAGREEMENTS XENON COMPOUND METHOD
摘要 PURPOSE: A method for forming a silicon structure using a xenon fluoride compound is provided to form a silicon trench of a high aspect ratio, thereby saving energy used for a process. CONSTITUTION: A silicon structure is formed by at least one mask. A first mask(110) is made by silicon and a membrane with a selectivity ratio. A first mask is made of oxynitride, A second mask(120) is made of a xenon fluoride compound or xenon fluoride. The xenon fluoride compound can be XeF2, XeF4, and XeF6. The xenon fluoride is formed by combining xenon fluoride compounds by discharging xenon and the xenon fluoride compound.
申请公布号 KR20110084869(A) 申请公布日期 2011.07.26
申请号 KR20110067631 申请日期 2011.07.08
申请人 CHO, IN SUK 发明人 CHO, IN SUK
分类号 H01L21/3065 主分类号 H01L21/3065
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