| 摘要 |
PURPOSE: A probe is provided to make a test current steadily flow by contacting a plunger with the inner side of a barrel. CONSTITUTION: A probe protrusion is connected with the connection terminal of semiconductor and is formed in the top part(12) of a plunger. A lower part(40) of the plunger is inserted into the lower part of a barrel(20) and the lower part of the barrel is contacted with the contact terminal of a circuit board for test. A coil spring(30) is contained in the barrel and elastically supports the pressure from the lower part delivered to an upper part(10) of the plunger in the process of a semiconductor chip test. A first hitching projection(44a) and a second hitching projection(44b) are respectively formed in the upper part of the plunger and the lower part of the plunger. The first hitching projection is fitted inside of the inward bend part(22) of the barrel formed in the both end parts of the first hitching projection. The second hitching projection is contacted with the inner side of the barrel. |
