发明名称 |
INTEGRATED TRENCH GUARDED SCHOTTKY DIODE COMPATIBLE WITH POWERDIE, STRUCTURE AND METHOD |
摘要 |
PURPOSE: An integrated trench guarded Schottky diode compatible with a power die, a structure and a method is provided to reduce holes within a PMOS device or electrons within an NMOS device. CONSTITUTION: A semiconductor device(10) includes a trench guarded Schottky diode which can be a low side FET circuit(16). Co-package dies include the first IC die with a control circuit(12). The control circuit includes MOSFETs. The second MOSFET includes a high side FET(14) and a low side FET on a single semiconductor die. The high side FET is electrically connected to a VIN pin-out while a device is being operated. The low side FET is electrically connected to a power ground pin-out while the device is being operated. The interlink between the high side FET and the low side FET can be called half bridge. |
申请公布号 |
KR20110079553(A) |
申请公布日期 |
2011.07.07 |
申请号 |
KR20100138862 |
申请日期 |
2010.12.30 |
申请人 |
INTERSIL AMERICAS INC. |
发明人 |
DEV ALOK GIRDHAR;FRANCOIS HEBERT |
分类号 |
H01L29/775;H01L29/872 |
主分类号 |
H01L29/775 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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