发明名称 INTEGRATED TRENCH GUARDED SCHOTTKY DIODE COMPATIBLE WITH POWERDIE, STRUCTURE AND METHOD
摘要 PURPOSE: An integrated trench guarded Schottky diode compatible with a power die, a structure and a method is provided to reduce holes within a PMOS device or electrons within an NMOS device. CONSTITUTION: A semiconductor device(10) includes a trench guarded Schottky diode which can be a low side FET circuit(16). Co-package dies include the first IC die with a control circuit(12). The control circuit includes MOSFETs. The second MOSFET includes a high side FET(14) and a low side FET on a single semiconductor die. The high side FET is electrically connected to a VIN pin-out while a device is being operated. The low side FET is electrically connected to a power ground pin-out while the device is being operated. The interlink between the high side FET and the low side FET can be called half bridge.
申请公布号 KR20110079553(A) 申请公布日期 2011.07.07
申请号 KR20100138862 申请日期 2010.12.30
申请人 INTERSIL AMERICAS INC. 发明人 DEV ALOK GIRDHAR;FRANCOIS HEBERT
分类号 H01L29/775;H01L29/872 主分类号 H01L29/775
代理机构 代理人
主权项
地址