发明名称 REFRACTIVE INDEX DISTRIBUTION MEASURING METHOD AND REFRACTIVE INDEX DISTRIBUTION MEASURING APPARATUS
摘要 PURPOSE: A method and a device for measuring refractive index profile is provided to accurately produce optical elements even if the optical elements are formed using a glass material with high refractive index. CONSTITUTION: A method for measuring refractive index profile is as follows. An object(40) is arranged on a first medium which has a lower refractive index than the object. The first penetrated wave surface of the object is measured by irradiating a reference beam to the object. The object is arranged on a second medium which has a refractive index different from the first medium. the second penetrated wave surface of the object is measured by irradiating a reference beam to the object. The inner refractive index profile of the object is computed.
申请公布号 KR20110055396(A) 申请公布日期 2011.05.25
申请号 KR20100110789 申请日期 2010.11.09
申请人 CANON KABUSHIKI KAISHA 发明人 SUGIMOTO TOMOHIRO
分类号 G01M11/04;G01M11/02;G01N21/45 主分类号 G01M11/04
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