发明名称 |
REFRACTIVE INDEX DISTRIBUTION MEASURING METHOD AND REFRACTIVE INDEX DISTRIBUTION MEASURING APPARATUS |
摘要 |
PURPOSE: A method and a device for measuring refractive index profile is provided to accurately produce optical elements even if the optical elements are formed using a glass material with high refractive index. CONSTITUTION: A method for measuring refractive index profile is as follows. An object(40) is arranged on a first medium which has a lower refractive index than the object. The first penetrated wave surface of the object is measured by irradiating a reference beam to the object. The object is arranged on a second medium which has a refractive index different from the first medium. the second penetrated wave surface of the object is measured by irradiating a reference beam to the object. The inner refractive index profile of the object is computed.
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申请公布号 |
KR20110055396(A) |
申请公布日期 |
2011.05.25 |
申请号 |
KR20100110789 |
申请日期 |
2010.11.09 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
SUGIMOTO TOMOHIRO |
分类号 |
G01M11/04;G01M11/02;G01N21/45 |
主分类号 |
G01M11/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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