发明名称 WIRING STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING WIRING STRUCTURE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a wiring structure of a semiconductor device and a method for manufacturing the wiring structure. <P>SOLUTION: In a method for forming the wiring structure of the semiconductor device, a first insulator film is formed on a substrate having a cell region and a peripheral circuit region, and a first contact plug having a first conductive material, which extends through the first insulator film, is formed in the cell region. A first conductive line covering and integrated with the first contact plug, which has the first conductive material, is formed at substantially the same time when the first contact plug is formed. A second contact plug having the first conductive material, which extends through the first insulator film, is formed in the peripheral circuit region at substantially the same time when the first contact plug is formed. A second conductive line covering and integrated with the second contact plug, which has the first conductive material, is formed at substantially the same time when the second contact plug is formed. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011086941(A) 申请公布日期 2011.04.28
申请号 JP20100230439 申请日期 2010.10.13
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE EUN-OK;KIN DAIYO;CHOI GIL-HEYUN;KIN HEIKI
分类号 H01L27/108;H01L21/3205;H01L21/768;H01L21/8242;H01L23/52;H01L23/522 主分类号 H01L27/108
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