发明名称 DUAL POROSITY STRUCTURE POLISHING PAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad reducing defects and increasing polishing speed. <P>SOLUTION: A porous polishing layer includes a dual porosity structure in a polyurethane matrix. The dual porosity structure includes a primary set of pores having pore walls with a thickness of 15 to 55 &mu;m and a storage modulus of 10 to 60 MPa measured at 25&deg;C. In addition, the pore walls contain a secondary set of pores having an average pore size of 5 to 30 &mu;m. The porous polishing layer is either fixed to a polymeric film or sheet substrate or formed into a woven or non-woven structure to form the polishing pad. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011067945(A) 申请公布日期 2011.04.07
申请号 JP20100216044 申请日期 2010.09.27
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC 发明人 JAMES DAVID B;SANFORD-CRANE HENRY
分类号 B24B37/00;H01L21/304 主分类号 B24B37/00
代理机构 代理人
主权项
地址