发明名称 |
DUAL POROSITY STRUCTURE POLISHING PAD |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a polishing pad reducing defects and increasing polishing speed. <P>SOLUTION: A porous polishing layer includes a dual porosity structure in a polyurethane matrix. The dual porosity structure includes a primary set of pores having pore walls with a thickness of 15 to 55 μm and a storage modulus of 10 to 60 MPa measured at 25°C. In addition, the pore walls contain a secondary set of pores having an average pore size of 5 to 30 μm. The porous polishing layer is either fixed to a polymeric film or sheet substrate or formed into a woven or non-woven structure to form the polishing pad. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011067945(A) |
申请公布日期 |
2011.04.07 |
申请号 |
JP20100216044 |
申请日期 |
2010.09.27 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC |
发明人 |
JAMES DAVID B;SANFORD-CRANE HENRY |
分类号 |
B24B37/00;H01L21/304 |
主分类号 |
B24B37/00 |
代理机构 |
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