发明名称 PROCESS DEVICE WITH SAMPLING SKEW
摘要 An industrial process device for monitoring or controlling an industrial process includes a first input configured to receive a first plurality of samples related to a first process variable and a second input configured to receive a second plurality of samples related to a second process variable. Compensation circuitry is configured to compensate for a time difference between the first plurality of samples and the second plurality of samples and provide a compensated output related to at least one of the first and second process variables. The compensated output can comprise, or can be used to calculate a third process variable. The third process variable can be used to monitor or control the industrial process.
申请公布号 US2011082568(A1) 申请公布日期 2011.04.07
申请号 US20090571622 申请日期 2009.10.01
申请人 SCHULTE JOHN P 发明人 SCHULTE JOHN P.
分类号 G05B13/02 主分类号 G05B13/02
代理机构 代理人
主权项
地址