IR detector system and method

摘要

A system and method of reducing undesirable image artefacts such as image tear and image smearing is described. The system comprises a group of pixels and enhanced sensitivity circuit means. The circuit means are configured so as to operate in an enhanced sensitivity mode and comprise a combination of sample and hold circuit means M21/Ch1 and M22/Ch2 and binning function means M7, in which the sample of a first pixel in the group integrates onto a first sample and hold capacitor Ch1 using combined integration capacitance Cint1 + Cint2 + Ch1, but not onto the other sample and hold capacitor Ch2. The second pixel is then sampled using combined integration capacitance Cint1 + Cint2 + Ch2. An advantage of this approach is that the field capture times are separated only by the stare time (0.6ms) of the first field and reset time of the second field (0.05ms) and reduces smear or multiple images on fast moving targets.