发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF TESTING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device that facilitates a registration of a defective block. <P>SOLUTION: The nonvolatile semiconductor memory device includes: a memory cell array with a plurality of blocks each being the erasing unit; a ready/busy control circuit that outputs a busy signal when an internal operation is being done to the blocks; and a control unit that registers the blocks as defective blocks when the ready/busy control circuit outputs the busy signal in receiving an input of a bad block command. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011065694(A) 申请公布日期 2011.03.31
申请号 JP20090213989 申请日期 2009.09.16
申请人 TOSHIBA CORP 发明人 KOMATSU YUKIO
分类号 G11C29/12;G01R31/28;G11C16/02 主分类号 G11C29/12
代理机构 代理人
主权项
地址