发明名称 |
SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDUCTOR TESTING APPARATUS, AND SEMICONDUCTOR TESTING METHOD |
摘要 |
A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.
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申请公布号 |
US2011057681(A1) |
申请公布日期 |
2011.03.10 |
申请号 |
US20100873738 |
申请日期 |
2010.09.01 |
申请人 |
FUJITSU LIMITED;FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
WATANABE YUICHI;SHINADA KIYOTAKA;KIMURA YUUSHIN;GOTO SHIGERU;TANDOU YASUHIKO;TAKADA EIJI;UESAKA KOUJI |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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