发明名称 |
ELECTRO-DEPOSITION FIXED ABRASIVE GRAIN WIRE AND CRYSTAL SLICING METHOD USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for reducing processing damage in slicing semiconductor crystals such as hard-brittle Ga-containing nitride crystal. <P>SOLUTION: First, a metal seat (400) to which a carbon seat (200) attached with a GaN crystal (100) and a grinding wheel (20) for truing is fixed is set in a cutting device for slicing crystals by a multi-wire saw (1). Next, an oscillation angle of the plate-shaped GaN crystal (100) during a cutting process is determined by oscillating a wire (10). The wire (10) is repeatedly oscillated so that the wire (10) travels toward a center from an end of the GaN crystal (100), and the cutting process proceeds by lifting the metal seat (400) using a lifting motor. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011031386(A) |
申请公布日期 |
2011.02.17 |
申请号 |
JP20100146569 |
申请日期 |
2010.06.28 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
KOSHIHATA MASANOBU;DOI NARIHIRO;UCHIDA HIROBUMI |
分类号 |
B24D11/00;B24B27/06;B24B53/00;B24D3/00;B24D3/06;B28D5/04;H01L21/304 |
主分类号 |
B24D11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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