METHOD OF MANUFACTURING ELECTRONIC COMPONENT, AND INSPECTION METHOD OF ELECTRONIC COMPONENT

摘要

PROBLEM TO BE SOLVED: To provide a method for manufacturing an electronic component for less variations in quality and improved yield by suppressing fluctuation in oxygen deficit quantity.

SOLUTION: The method for manufacturing the electronic component includes an annealing step in which an elemental body having an electrode and a sintered body containing perovskite type oxide is annealed so that the sintered body is oxidized. It includes a first measuring step of measuring Raman spectrum of the perovskite type oxide before an annealing step, a second measuring step of measuring Raman spectrum of the perovskite type oxide after the annealing step, and an evaluation step of acquiring a shift amount of a peak in a lattice oscillation region based on the Raman spectrums measured by the first measuring step and the second measuring step.

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