Elektronische Testschaltung und Verfahren für das Testen eines Speicherbausteins,申请号DE20011001999-传众专利搜索

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发明名称	Elektronische Testschaltung und Verfahren für das Testen eines Speicherbausteins
摘要
申请公布号	DE10101999(B4)	申请公布日期	2011.02.03
申请号	DE20011001999	申请日期	2001.01.18
申请人	QIMONDA AG	发明人	LUEPKE, JENS;ERNST, WOLFGANG;KUHN, JUSTUS;MUELLER, JOCHEN;SCHITTENHELM, MICHAEL;POECHMUELLER, PETER;KRAUSE, GUNNAR
分类号	G11C29/56	主分类号	G11C29/56
代理机构		代理人
主权项
地址

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