发明名称 CMP POLISHING LIQUID, AND POLISHING METHOD USING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide CMP (Chemical Mechanical Polishing) polishing liquid capable of rapidly polishing a metal containing copper with excellent flatness. <P>SOLUTION: The CMP polishing liquid for polishing a metal containing copper includes abrasive grains 10, oxide metal dissolving agent, oxidizing agent, corrosion-resistant agent, water-soluble polymer and water. The pH value of the CMP polishing liquid is≤7. The abrasive grains is subjected to anion processing. The mean primary particle diameter of the abrasive grains is 10-80 nm. The mean secondary particle diameter of the abrasive grains is 25-250 nm. The degree of association obtained by dividing the mean secondary particle diameter by the mean primary particle diameter is≥2.3. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011020208(A) 申请公布日期 2011.02.03
申请号 JP20090166967 申请日期 2009.07.15
申请人 HITACHI CHEM CO LTD 发明人 OKADA YUHEI;MISHIMA KOJI;HAGA KOJI
分类号 B24B37/00;B82Y10/00;H01L21/304 主分类号 B24B37/00
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