发明名称 |
METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR SUBSTRATE |
摘要 |
<p>Disclosed is a method for manufacturing a nitride semiconductor substrate, which is capable of suppressing polycrystalline growth and efficiently manufacturing the nitride semiconductor substrate having a nonpolar plane as a main surface. Specifically disclosed is a method for manufacturing a GaN substrate that is a nitride semiconductor substrate, the method being provided with a step (S10, S20) for preparing a base substrate produced from GaN and having a main surface with an off angle of 4.1°-47.8° with respect to the [1-100] plane, a step (S40) for epitaxially growing a semiconductor layer produced from GaN on the main surface of the base substrate, and a step (S50) for obtaining the GaN substrate having the m plane as a main surface from the semiconductor layer.</p> |
申请公布号 |
WO2011004726(A1) |
申请公布日期 |
2011.01.13 |
申请号 |
WO2010JP60962 |
申请日期 |
2010.06.28 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES,LTD.;OSADA, HIDEKI;UEMATSU, KOJI;NAKAHATA, SEIJI;NAKANISHI, FUMITAKE |
发明人 |
OSADA, HIDEKI;UEMATSU, KOJI;NAKAHATA, SEIJI;NAKANISHI, FUMITAKE |
分类号 |
C30B29/38;C23C16/01;C30B25/20 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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