发明名称 METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR SUBSTRATE
摘要 <p>Disclosed is a method for manufacturing a nitride semiconductor substrate, which is capable of suppressing polycrystalline growth and efficiently manufacturing the nitride semiconductor substrate having a nonpolar plane as a main surface. Specifically disclosed is a method for manufacturing a GaN substrate that is a nitride semiconductor substrate, the method being provided with a step (S10, S20) for preparing a base substrate produced from GaN and having a main surface with an off angle of 4.1°-47.8° with respect to the [1-100] plane, a step (S40) for epitaxially growing a semiconductor layer produced from GaN on the main surface of the base substrate, and a step (S50) for obtaining the GaN substrate having the m plane as a main surface from the semiconductor layer.</p>
申请公布号 WO2011004726(A1) 申请公布日期 2011.01.13
申请号 WO2010JP60962 申请日期 2010.06.28
申请人 SUMITOMO ELECTRIC INDUSTRIES,LTD.;OSADA, HIDEKI;UEMATSU, KOJI;NAKAHATA, SEIJI;NAKANISHI, FUMITAKE 发明人 OSADA, HIDEKI;UEMATSU, KOJI;NAKAHATA, SEIJI;NAKANISHI, FUMITAKE
分类号 C30B29/38;C23C16/01;C30B25/20 主分类号 C30B29/38
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