发明名称 |
POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN USING THE SAME, AND FLUORINE-CONTAINING POLYMERIC COMPOUND |
摘要 |
<p>PURPOSE: A positive type resist composition is provided to prevent defects in development and to suppress the elution of materials in immersion exposure. CONSTITUTION: A positive type resist composition includes: a fluorine-containing polymeric compound containing a component with dissolution property in an alkali developer as a block copolymerization part; a substrate component with increased solubility to the alkali developer by the action of acids; and an acid generator for generating acids by exposure.</p> |
申请公布号 |
KR20110003262(A) |
申请公布日期 |
2011.01.11 |
申请号 |
KR20100060638 |
申请日期 |
2010.06.25 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
MATSUMIYA TASUKU;SHIONO DAIJU;HIRANO TOMOYUKI;DAZAI TAKAHIRO |
分类号 |
G03F7/039;C08F214/18;G03F7/004;H01L21/027 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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