发明名称 POSITIVE RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN USING THE SAME, AND FLUORINE-CONTAINING POLYMERIC COMPOUND
摘要 <p>PURPOSE: A positive type resist composition is provided to prevent defects in development and to suppress the elution of materials in immersion exposure. CONSTITUTION: A positive type resist composition includes: a fluorine-containing polymeric compound containing a component with dissolution property in an alkali developer as a block copolymerization part; a substrate component with increased solubility to the alkali developer by the action of acids; and an acid generator for generating acids by exposure.</p>
申请公布号 KR20110003262(A) 申请公布日期 2011.01.11
申请号 KR20100060638 申请日期 2010.06.25
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 MATSUMIYA TASUKU;SHIONO DAIJU;HIRANO TOMOYUKI;DAZAI TAKAHIRO
分类号 G03F7/039;C08F214/18;G03F7/004;H01L21/027 主分类号 G03F7/039
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