发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which is excellent in soft error resistance and includes a fine structure.SOLUTION: The present invention includes a memory cell region Cell including a plurality of transistors and a core region Core arranged adjacent to the memory cell region Cell. The memory cell region Cell and the core region Core are provided with a substrate 1, a p-type well region 2 and an n-type well region 3, both of which are formed on the substrate 1. Moreover, the memory cell region Cell includes the substrate 1 and a p-type deep well region 5a that is formed under the p-type well region 2 and the n-type well region 3. The p-type deep well region 5a is adjacent to at least the p-type well region 2.
申请公布号 JP2011003830(A) 申请公布日期 2011.01.06
申请号 JP20090147484 申请日期 2009.06.22
申请人 RENESAS ELECTRONICS CORP 发明人 NAKAMURA HIDEYUKI;TAKAHASHI HISASHI;IKEDA YUJI;MINAGAWA SUMUTO
分类号 H01L27/10;H01L21/8234;H01L21/8238;H01L27/08;H01L27/088;H01L27/092 主分类号 H01L27/10
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