发明名称 System and method for reducing corrosion of an integrated circuit through its bond pads
摘要 A bond pad structure has a first conductive layer and an anti-reflective coating layer disposed on the first conductive layer. The first conductive layer includes first and second portions (which could be formed by etching). Part of the first portion is exposed within a bond pad opening, and the second portion is electrically connected to an integrated circuit. The anti-reflective coating layer also includes first and second portions (which could be formed by etching). The first portion may be located near the bond pad opening, and the second portion may be located farther away from the bond pad opening. A second conductive layer electrically connects the first and second portions of the first conductive layer. In this way, the first portion of the anti-reflective coating layer may undergo oxidation without leading to oxidation of the second portion of the anti-reflective coating layer.
申请公布号 US7863184(B1) 申请公布日期 2011.01.04
申请号 US20090456116 申请日期 2009.06.11
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 BOLD THOMAS
分类号 H01L21/00 主分类号 H01L21/00
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