发明名称 PROCESSING METHOD AND STORAGE MEDIUM
摘要 There is provided a processing method for performing a recovery process on a damaged layer formed on a surface of a low-k film of a target substrate by introducing a processing gas containing a methyl group into a processing chamber. The method includes: increasing an internal pressure of the processing chamber up to a first pressure lower than a processing pressure for the recovery process by introducing a dilution gas into the processing chamber maintained in a depressurized state; then stopping the introduction of the dilution gas, and increasing the internal pressure of the processing chamber up to a second pressure as the processing pressure for the recovery process by introducing the processing gas into a region where the target substrate exists within the processing chamber; and performing the recovery process on the target substrate while the processing pressure is maintained.
申请公布号 US2010304505(A1) 申请公布日期 2010.12.02
申请号 US20100791082 申请日期 2010.06.01
申请人 TOKYO ELECTRON LIMITED 发明人 SHIMIZU WATARU;KUBOTA KAZUHIRO;HAYASHI DAISUKE
分类号 H01L21/30 主分类号 H01L21/30
代理机构 代理人
主权项
地址