发明名称 DEVELOPMENT APPARATUS FOR SEMICONDUCTOR DEVICE AND DEVELOP METHOD USING IT
摘要 <p>PURPOSE: A semiconductor device development apparatus and a developing method using the same are provided to prevent the impurity from remaining on a wafer by controlling the time of gas or rinse discharged from a plurality of nozzle in consideration of rotation of the wafer. CONSTITUTION: A chamber offers the space accepting a wafer(102). A plurality of nozzles(120) respectively discharges the discharged material. A spin chuck(100) rotates the wafer. A front side of the wafer is spread with the developer(104). The rinse(106) is discharged through a first nozzle located on the center of the wafer.</p>
申请公布号 KR20100125689(A) 申请公布日期 2010.12.01
申请号 KR20090044517 申请日期 2009.05.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YANG, CHEOL HOON
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址