发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To improve the bonding yield and bonding reliability, by eliminating an influence of a resin remainder on a bonding surface between the surface of a bump electrode and an inner lead, even when applying a resin onto the surface of a tape substrate and bonding the bump electrode of a semiconductor element to the inner lead. <P>SOLUTION: By having a recess formed in a bump electrode 7 on the surface of a semiconductor element 3, and an inner lead 2 formed in a wiring substrate 1 bonded to the recess of the bump electrode 7, even when a resin 8 is applied beforehand for bonding, the resin 8 is also placed in the recess of the bump electrode 7 so that the periphery of the bump electrode 7 can be bonded to the inner lead 2 at one or more locations; and high-yield and high-reliability bonding becomes possible, without blocking the bonding in the vicinity of the recess. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010267686(A) 申请公布日期 2010.11.25
申请号 JP20090116034 申请日期 2009.05.13
申请人 PANASONIC CORP 发明人 TAMAKI YUKI;SHIMOISHIZAKA NOZOMI;SUAI HISAO
分类号 H01L21/60 主分类号 H01L21/60
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