发明名称 INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide an inspection apparatus executing confirmation of lighting of a light-emitting element packaged on a substrate without any worker's determination. SOLUTION: The apparatus for inspecting an element 21 having current-voltage characteristics to be packaged on the substrate includes: a means 12 for increasing/decreasing current flowing to an inspecting element; a means 13 for reading voltage applied to the element; a means 11 for determining the current-voltage characteristics of the element and a combination of current-voltage changing according to a circuit block around the element for recording the result in a table; and a pass/fail determining means 11 for determining a combination of current flowing to the element by a current increasing/decreasing means and voltage read by a voltage reading means and applied to the element according to recording in the table for a plurality of times. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2010266220(A) 申请公布日期 2010.11.25
申请号 JP20090115428 申请日期 2009.05.12
申请人 RICOH CO LTD 发明人 ARAI MICHIAKI
分类号 G01R31/26;G01R31/28 主分类号 G01R31/26
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