发明名称 |
METHOD FOR MEASURING THICKNESS OF AN OPTICAL DISC |
摘要 |
A method of measuring thickness of an optical disc by using an interference effect of the optical disc layer is disclosed. The method includes detecting an intensity of a reflective light according to a wavelength of a light as spectrum data for each wavelength, converting the detected spectrum data for each wavelength into a spectrum value as a function of a wavelength that a refractive index is reflected, and detecting a position where the intensity of the reflective light has a peak as a thickness of a spacer layer and a cover layer respectively by converting the converted value into a length of an interference area for representing a layer thickness of the optical disc by the Fast Fourier Transform. The disclosed method has advantages for high precisely measuring thickness of an optical disc.
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申请公布号 |
CA2490094(C) |
申请公布日期 |
2010.11.23 |
申请号 |
CA20032490094 |
申请日期 |
2003.06.24 |
申请人 |
LG ELECTRONICS INC. |
发明人 |
JEONG, SEONG YUN;KIM, JIN YONG;KIM, JIN HONG;SEO, HUN;KWAK, KEUM CHEOL |
分类号 |
G01B11/06;G11B7/26;G01B9/02;G02F1/00;G11B7/0037 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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