| 摘要 |
An electronic device testing apparatus for conducting a test by pressing input/output terminals of an IC to be tested against sockets (50), comprising a pusher (30) provided at least with a pusher base (34) provided to be able to approach and separate with respect to said sockets (50), a lead pusher base (35) fixed to said pusher base (34), a pusher block (31) for pressing against said sockets (50) by contacting said IC to be tested from an opposite face of said socket (50), a load base (32) attached with the pusher block (31), and two springs (36, 38) for giving an elastic force in the direction of pressing the IC to be tested to the pusher block (31) via the load base (32), wherein the load base (32) and the springs (36, 38) are sandwiched with the lead pusher base (35) and the pusher base (34), and the pusher block (31) is detachably attached to the load base (32) via an opening portion provided to the pusher base (34).
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