| 摘要 |
The invention relates to an optical system (1) comprising an optical unit (10) with an optical axis (10a) extending through a light transmissive sample embedded in a transparent substrate (30), to focus on said sample embedded in said transparent substrate (30) and to scan said sample according to the main plane of said transparent substrate (30), wherein the optical axis (10a) extends under an angle unequal to zero relative to the normal of the main plane of said transparent substrate (30). This allows to perform the volumetric observation of a sample by obtaining information items focused in all thickness directions within the sample, at a high speed, without requiring any motion along the thickness direction of the sample. Preferably a substantially wedge shaped transparent compensation body (40) is arranged in the optical axis between the optical unit (10) and the transparent substrate (30), the refraction index whereof is substantially equal to the refraction index of the transparent substrate. |
