发明名称 DEVICE, METHOD AND PROGRAM FOR MEASUREMENT CONTROL
摘要 PROBLEM TO BE SOLVED: To provide technology of improving frequency accuracy of measurement results by a spectrum analyzer in measurement using the spectrum analyzer. SOLUTION: A real frequency acquisition part 121 acquires real frequency of an output signal of a signal generator in frequency calibration of the spectrum analyzer. A measurement frequency acquisition part 122 acquires measurement frequency with the maximum level value measured when the spectrum analyzer measures the output signal of the signal generator. A frequency correction data generation part 123 generates frequency correction data for correcting the measurement frequency of the spectrum analyzer from relation between the real frequency and the measurement frequency. In preliminary measurement using the spectrum analyzer, a measurement data acquisition part 131 acquires measurement data of the spectrum analyzer. A frequency correction part 134 corrects the measurement frequency of the spectrum analyzer included in the measurement data by means of the frequency correction data. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010217060(A) 申请公布日期 2010.09.30
申请号 JP20090065485 申请日期 2009.03.18
申请人 FUJITSU LTD 发明人 MIYATA KUNIYUKI
分类号 G01R23/173;G01R29/08 主分类号 G01R23/173
代理机构 代理人
主权项
地址
您可能感兴趣的专利