发明名称 System And Method For Measuring Drop Position In An Image Of A Test Pattern On An Image Substrate
摘要 A system evaluates image quality in an image generating system in the presence of digital image noise and/or missing jets. The system includes a test pattern generator configured to generate a test pattern on an image substrate, an image capture device configured to generate a digital image of the generated test pattern on the image substrate, an image evaluator configured to process the digital image and generate a solution for an over-determined matrix of equations formed from differential distance measurements obtained with reference to a jet in the digital image by minimizing the root-mean-square (RMS) of residual errors corresponding to the matrix, and a controller configured to generate a correction parameter from the generated solution and to apply the correction parameter to the jet used for the used for the differential distance measurements.
申请公布号 US2010238220(A1) 申请公布日期 2010.09.23
申请号 US20090408151 申请日期 2009.03.20
申请人 XEROX CORPORATION 发明人 YEH ANDREW S.;SJOLANDER CARY ERIC
分类号 B41J29/38;G06K9/00 主分类号 B41J29/38
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