发明名称 Diagnostic Test Sequence Optimization Method and Apparatus
摘要 A method for optimizing a test sequence to diagnose a failure mode of a device, such as a vehicle, is provided. At least one symptom of a fault of the device is received, and a plurality of taxonomies is generated. The taxonomies include a device component taxonomy, a fault taxonomy, and a diagnostic taxonomy, and each taxonomy has a plurality of nodes. At least one diagnostic test sequence, based on the symptom and the taxonomies, is generated, costs associated with the diagnostic test sequence are determined, and a cost optimal test sequence, based on the costs and the diagnostic test sequence, is generated.
申请公布号 US2010229044(A1) 申请公布日期 2010.09.09
申请号 US20090399963 申请日期 2009.03.08
申请人 SPX CORPORATION 发明人 FOUNTAIN GREGORY;GILBERT HARRY;MAYES RANDY;PORTYANKO OLEKSIY;UNDERDAL OLAV;WITTLIFF, III WILLIAM
分类号 G06F11/07 主分类号 G06F11/07
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