发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor light-receiving element having high detection efficiency and dark counting rate in detecting a weak light, and to provide a method of manufacturing the semiconductor light-receiving element. <P>SOLUTION: The semiconductor light-receiving element 10 is provided with a first conductivity-type multiplication region 13, and a second conductivity-type multiplication region 12. The multiplication region 12 is formed so as to contact the multiplication region 13. The multiplication region 13 has an impurity concentration range of 1&times;10<SP>14</SP>cm<SP>-3</SP>to 5&times;10<SP>15</SP>cm<SP>-3</SP>. The multiplication region 12 has an impurity concentration higher than the impurity concentration of the multiplication region 13, and a thickness of 0.2 &mu;m-0.3 &mu;m. The multiplication region 12, preferably, has an impurity concentration of 5&times;10<SP>15</SP>cm<SP>-3</SP>to 8&times;10<SP>17</SP>cm<SP>-3</SP>. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP4537880(B2) 申请公布日期 2010.09.08
申请号 JP20050118524 申请日期 2005.04.15
申请人 发明人
分类号 H01L31/107;H01L27/146 主分类号 H01L31/107
代理机构 代理人
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