发明名称
摘要 <p>The present invention provides a technology which can suppress a variation in a value after a write operation to minimum so as to facilitate multi-bit operation in a semiconductor device such as a phase change memory. A semiconductor device includes: a memory cell having a storage element (phase change material) that stores information depending on a state change by temperature; an I/O circuit; and means which, when writing data, performs a set operation and an operation for writing desired data, measures a resistance value of the storage element by means of a verify operation, and when the resistance value is not within a target range, performs the set operation and the write operation again while changing a voltage to be applied to the storage element.</p>
申请公布号 JP4524455(B2) 申请公布日期 2010.08.18
申请号 JP20040341475 申请日期 2004.11.26
申请人 发明人
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项
地址