发明名称 Method of forming transistor having channel region at sidewall of channel portion hole
摘要 According to some embodiments of the invention, a method of forming a transistor includes forming a device isolation layer in a semiconductor substrate. The device isolation layer is formed to define at least one active region. A channel region is formed in a predetermined portion of the active region of the semiconductor substrate. Two channel portion holes are formed to extend downward from a main surface of the semiconductor substrate to be in contact with the channel region. Gate patterns fill the channel portion holes and cross the active region. The resulting transistor is capable of ensuring a constant threshold voltage without being affected by an alignment state of the channel portion hole and the gate pattern.
申请公布号 US7767531(B2) 申请公布日期 2010.08.03
申请号 US20090418359 申请日期 2009.04.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN SOO-HO;LEE JIN-WOO;LEE EUN-CHEOL
分类号 H01L21/336;H01L21/3205;H01L21/425;H01L21/8242 主分类号 H01L21/336
代理机构 代理人
主权项
地址