发明名称 |
CONTACT TYPE PROBE USING FLEXIBLE WIRE |
摘要 |
PURPOSE: A contact type probe using a flexible wire is provided to improve the adaptability with respect to the height variation of a measurement target by securing a height margin as much as the bent length of the flexible wire. CONSTITUTION: A probe is combined with the failure inspecting unit with respect to a pattern electrode(15) and pressing and transferring unit(50). The pattern electrode is contacted with a flexible wire(40). The pattern electrode scans the vertical direction of the pattern electrode using the flexible wire which is bent to a scanning direction. The probe touches the upper side of the pattern electrode in order to inspect a disconnection failure and a short circuit failure. |
申请公布号 |
KR20100086708(A) |
申请公布日期 |
2010.08.02 |
申请号 |
KR20090006075 |
申请日期 |
2009.01.23 |
申请人 |
MICROINSPECTION, INC. |
发明人 |
EUN, TAK;KIM, SEONG JIN;LEE, DONG JUN;CHANG, SUNG JUN |
分类号 |
G01R1/073;G01R1/067 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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