发明名称 CONTACT TYPE PROBE USING FLEXIBLE WIRE
摘要 PURPOSE: A contact type probe using a flexible wire is provided to improve the adaptability with respect to the height variation of a measurement target by securing a height margin as much as the bent length of the flexible wire. CONSTITUTION: A probe is combined with the failure inspecting unit with respect to a pattern electrode(15) and pressing and transferring unit(50). The pattern electrode is contacted with a flexible wire(40). The pattern electrode scans the vertical direction of the pattern electrode using the flexible wire which is bent to a scanning direction. The probe touches the upper side of the pattern electrode in order to inspect a disconnection failure and a short circuit failure.
申请公布号 KR20100086708(A) 申请公布日期 2010.08.02
申请号 KR20090006075 申请日期 2009.01.23
申请人 MICROINSPECTION, INC. 发明人 EUN, TAK;KIM, SEONG JIN;LEE, DONG JUN;CHANG, SUNG JUN
分类号 G01R1/073;G01R1/067 主分类号 G01R1/073
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