发明名称 PROBE AND PROBE CARD
摘要 PROBLEM TO BE SOLVED: To reduce the array pitch of a probe and to enable an electrode section to be used for a conduction test of a densely-arranged specimen. SOLUTION: The probe includes a needle body which extends laterally and a needlepoint which is bent obliquely and downward, from one end of the needle body. In the needle body and the needlepoint, a region having an oval or rectangular cross-sectional shape with the dimension in the forward-backward direction smaller than the dimension in the vertical or lateral direction is provided at the boundary between the needle body and the needlepoint and in its vicinity. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010164452(A) 申请公布日期 2010.07.29
申请号 JP20090007452 申请日期 2009.01.16
申请人 MICRONICS JAPAN CO LTD 发明人 SUGIYAMA TADASHI;SAKAMOTO JUN
分类号 G01R1/067;G01R1/073;G01R31/26;H01L21/66 主分类号 G01R1/067
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