发明名称 |
EPITAXIAL WAFER AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PURPOSE: An epitaxial wafer and a manufacturing method thereof are provided to prevent a bowing phenomenon by forming a back seal layer with a tensile stress film. CONSTITUTION: A substrate(201) is doped with a first doping density. An epi layer(202) is formed on the upper side of a substrate and is doped with a second doping density lower than the first doping density. A back seal layer(203) is formed on the rear of the substrate and includes a poly silicon layer and a silicon nitride layer. The poly silicon layer is formed on the rear of the substrate. The silicon nitride layer is formed on the upper side of the poly silicon layer.
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申请公布号 |
KR20100075239(A) |
申请公布日期 |
2010.07.02 |
申请号 |
KR20080133881 |
申请日期 |
2008.12.24 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
CHA, HAN SEOB |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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