发明名称 PLASMA PROCESSING APPARATUS
摘要 A plasma processing apparatus for processing a surface of a to-be-processed substrate includes a processing chamber, a first electrode provided in the processing chamber, a second electrode arranged in opposition to the first electrode, a main power source for supplying the first or second electrode with power for generating a plasma, a biasing power source for supplying the second or first electrode with biasing power, a gas supplying unit for supplying a processing gas into the processing chamber and a control unit for controlling the main power source, the biasing power source and the gas supplying unit. The control unit performs a control such that, during a time of transition from a stationary state of plasma, in which a plasma processing is to be carried out, to a plasma quenching, an output of the main power source is kept not larger than an output of the biasing power source.
申请公布号 US2010163184(A1) 申请公布日期 2010.07.01
申请号 US20090370215 申请日期 2009.02.12
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 ICHINO TAKAMASA;NISHIO RYOJI;TAMURA TOMOYUKI;OBAMA SHINJI
分类号 H01L21/3065;H01L21/205 主分类号 H01L21/3065
代理机构 代理人
主权项
地址