发明名称 Method of Manufacturing a Semiconductor Device
摘要 At present, a forming process of a base film through an amorphous silicon film is conducted in respective film forming chambers in order to obtain satisfactory films. When continuous formation of the base film through the amorphous silicon film is performed in a single film forming chamber with the above film formation condition, crystallization is not sufficiently attained in a crystallization process. By forming the amorphous silicon film using silane gas diluted with hydrogen, crystallization is sufficiently attained in the crystallization process even with the continuous formation of the base film through the amorphous silicon film in the single film forming chamber.
申请公布号 US2010151664(A1) 申请公布日期 2010.06.17
申请号 US20100712397 申请日期 2010.02.25
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 ASAMI TAKETOMI;ICHIJO MITSUHIRO;TORIUMI SATOSHI
分类号 H01L21/205;H01L21/20;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L27/32;H01L29/786 主分类号 H01L21/205
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