发明名称 Non-volatile memory cells including fin structures
摘要 A method of forming a non-volatile memory device may include forming a fin protruding from a substrate, forming a tunnel insulating layer on portions of the fin, and forming a floating gate on the tunnel insulting layer so that the tunnel insulating layer is between the floating gate and the fin. A dielectric layer may be formed on the floating gate so that the floating gate is between the dielectric layer and the fin, and a control gate electrode may be formed on the dielectric layer so that the dielectric layer is between the control gate and the fin. Related devices are also discussed.
申请公布号 US7737485(B2) 申请公布日期 2010.06.15
申请号 US20080193200 申请日期 2008.08.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO EUN-SUK;LEE CHOONG-HO;KIM TAE-YONG
分类号 H01L29/94;H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L29/94
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