发明名称 Semiconductor Memory Device and a Method of Manufacturing the Same, A Method of Manufacturing a Vertical MISFET and a Vertical MISFET, and a Method of Manufacturing a Semiconductor Device and a Semiconductor Device
摘要 Vertical MISFETs are formed over drive MISFETs and transfer MISFETs. The vertical MISFETs comprise rectangular pillar laminated bodies each formed by laminating a lower semiconductor layer (drain), an intermediate semiconductor layer, and an upper semiconductor layer (source), and gate electrodes formed on corresponding side walls of the laminated bodies with gate insulating films interposed therebetween. In each vertical MISFET, the lower semiconductor layer constitutes a drain, the intermediate semiconductor layer constitutes a substrate (channel region), and the upper semiconductor layer constitutes a source. The lower semiconductor layer, the intermediate semiconductor layer and the upper semiconductor layer are each comprised of a silicon film. The lower semiconductor layer and the upper semiconductor layer are doped with a p type and constituted of a p type silicon film.
申请公布号 US2010136778(A1) 申请公布日期 2010.06.03
申请号 US20100700344 申请日期 2010.02.04
申请人 CHAKIHARA HIRAKU;OKUYAMA KOUSUKE;MONIWA MASAHIRO;MIZUNO MAKOTO;OKAMOTO KEIJI;NOGUCHI MITSUHIRO;YOSHIDA TADANORI;TAKAHSHI YASUHIKO;NISHIDA AKIO 发明人 CHAKIHARA HIRAKU;OKUYAMA KOUSUKE;MONIWA MASAHIRO;MIZUNO MAKOTO;OKAMOTO KEIJI;NOGUCHI MITSUHIRO;YOSHIDA TADANORI;TAKAHSHI YASUHIKO;NISHIDA AKIO
分类号 H01L21/28;H01L27/10;H01L21/336;H01L21/8238;H01L21/8244;H01L27/11;H01L29/786 主分类号 H01L21/28
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