发明名称 PHASE CHANGE MEMORY DEVICE AND VERIFICATION METHOD OF PROGRAMMING CURRENT FOR IT
摘要 PURPOSE: A phase change memory device and a verification method thereof are provided to program data by recognizing a programming current applying condition due to the property difference of a phase change memory cell. CONSTITUTION: A data reading part(320) reads data programmed in a phase change memory cell. A comparison part(330) compares output data outputted from the data reading part with applied test data. A write control part outputs a first and a second write control signal corresponding to test data. The write control part(340) activates and outputs a bias signal when two data are different from each other after the comparison. A data writing part(350) supplies a programming current to the phase change memory cell in response to the first and the second write control signal.
申请公布号 KR20100052886(A) 申请公布日期 2010.05.20
申请号 KR20080111767 申请日期 2008.11.11
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JONG SUNG;YEON, EUN MI
分类号 G11C13/02;G11C7/10;G11C7/22 主分类号 G11C13/02
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