发明名称 |
PHASE CHANGE MEMORY DEVICE AND VERIFICATION METHOD OF PROGRAMMING CURRENT FOR IT |
摘要 |
PURPOSE: A phase change memory device and a verification method thereof are provided to program data by recognizing a programming current applying condition due to the property difference of a phase change memory cell. CONSTITUTION: A data reading part(320) reads data programmed in a phase change memory cell. A comparison part(330) compares output data outputted from the data reading part with applied test data. A write control part outputs a first and a second write control signal corresponding to test data. The write control part(340) activates and outputs a bias signal when two data are different from each other after the comparison. A data writing part(350) supplies a programming current to the phase change memory cell in response to the first and the second write control signal.
|
申请公布号 |
KR20100052886(A) |
申请公布日期 |
2010.05.20 |
申请号 |
KR20080111767 |
申请日期 |
2008.11.11 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, JONG SUNG;YEON, EUN MI |
分类号 |
G11C13/02;G11C7/10;G11C7/22 |
主分类号 |
G11C13/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|