APPARATUS FOR MEASURING THE REFERENCE WAVEFRONT OF MIDDLE FREQUENCY INFRARED RAY LASER AND METHOD THEREOF

摘要

PURPOSE: A reference wavefront measuring system of a medium wave infrared laser and a method thereof are provided to apply a modified quadrature amplitude projection technique which removes noise from an obtained image by measuring the statistics of the noise by averaging frames. CONSTITUTION: A reference wavefront measuring system of a medium wave infrared laser comprises: a laser beam magnification/reduction optical system(110) which receives an output beam from a medium infrared laser; a lens array assembly(120) which optically spatial-samples the medium infrared laser beam; a medium infrared ray image detecting unit(130) which detects a middle infrared laser image which optically spatial-sampled; a fragment signal processing unit(140) which obtains and stores the medium infrared laser image which is detected from the medium infrared ray image detecting unit by a frame; and a system controller(150) which controls the laser beam magnification/reduction optical system, the lens array assembly, the medium infrared ray image detecting unit, and fragment signal processing unit.